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Lithium Niobate (LiNbO3) Substrate is...
HM2870
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Lithium Niobate (LiNbO3) Substrate is available in various types, making it suitable for optical, acoustic, and electronic applications. Heeger Materials is a professional supplier and manufacturer of high-quality LiNbO3 substrates, offering customized solutions and competitive prices.
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Materials | LiNbO3 Substrate |
Lithium Niobate (LiNbO3) Substrate is a widely used crystal material known for its excellent electro-optic, nonlinear optical, and piezoelectric properties. It comes in multiple types to suit different applications, including Optical Grade Lithium Niobate for photonic devices, Acoustic Grade Lithium Niobate for surface acoustic wave (SAW) applications, Blackened Lithium Niobate Wafers for specialized optical uses, Congruent Lithium Niobate Wafers for high-purity applications, Magnesium Oxide-Doped Lithium Niobate Wafers (MgO:LiNbO3) for enhanced resistance to optical damage, and Lithium Niobate Thin Film on Insulator (LNOI) Wafers for advanced integrated photonics. These substrates are widely used in optical modulators, frequency converters, SAW devices, and next-generation photonic circuits. Heeger Materials (HM) provides high-quality Lithium Niobate Substrates to meet the demands of research and industrial applications.
Material | Optical Grade LiNbO3 wafers (White or Black) | |
Curie Temp | 1142±2.0℃ | |
Cutting Angle | X/Y/Z etc | |
Diameter/size | 2”/3”/4” | |
Tol(±) | <0.20 mm | |
Thickness | 0.1 ~ 0.5mm or more | |
Primary Flat | 16mm/22mm /32mm | |
TTV | <3µm | |
Bow | -30<bow<30 | |
Warp | <40µm | |
Orientation Flat | All available | |
Surface Type | Single Side Polished /Double Sides Polished | |
Polished side Ra | <0.5nm | |
S/D | 20/10 | |
Edge Criteria | R=0.2mm or Bullnose | |
Optical doped | Fe/Zn/MgO, etc. for optical grade LN< wafers | |
Wafer Surface Criteria | Refractive index | No=2.2878/Ne=2.2033 @632nm wavelength |
Contamination, | None | |
Particles ¢>0.3 µ m | <= 30 | |
Scratch, Chipping | None | |
Defect | No edge cracks, scratches, saw marks, stains |
Material | LiNbO3 wafers (White or Black) | |
Curie Temp | 1142±2.0℃ | |
Cutting Angle | X/Y/Z/Y36/Y41/Y64/Y128/etc | |
Diameter/size | 3”/4”/6"LN wafer & 8"under R/D | |
Tol(±) | <0.20 mm | |
Thickness | 0.1 ~ 0.5mm or more | |
Primary Flat | 22mm /32mm /42.5mm /57.5mm | |
LTV (5mmx5mm) | <1µm | |
TTV | <3µm | |
Bow | -30<bow<30 | |
Warp | <40µm | |
PLTV(<0.5um) | ≥95%(5mm*5mm) | |
Orientation Flat | All available | |
Surface Type | Single Side Polished /Double Sides Polished | |
Polished side Ra | <0.5nm | |
Back Side Criteria | General is 0.2-0.5µm or as customized | |
Edge Criteria | R=0.2mm or Bullnose | |
Wafer Surface Criteria | Transmissivity | general:5.9x10-11<s<2.0*10-10 at 25℃ |
Contamination, | None | |
Particles ¢>0.3 µ m | <= 30 | |
Scratch, Chipping | None | |
Defect | No edge cracks, scratches, saw marks, stains |
Material | Black Lithium Niobate wafer | |
Curie Temp | 1142±2.0℃ | |
Cutting Angle | X/Y/Z/Y36/Y41/Y64/Y128/etc | |
Diameter/size | 3”/4”/6" & 8" LN wafer | |
Tol(±) | <0.20 mm ±0.005mm | |
Thickness | 0.18 ~ 0.5mm or more | |
Primary Flat | 22mm /32mm /42.5mm /57.5mm /semi-notch | |
TTV | <3µm | |
Bow | -30<bow<30 | |
Warp | <40µm | |
PLTV(<0.5um) | ≥95%(5mm*5mm) | |
Surface Type | Single Side Polished(SSP) /Double Sides Polished(DSP) | |
Polished side Ra | <0.5nm | |
S/D | 20/10 | |
Edge Criteria | R=0.2mm C-type or Bullnose | |
Quality | Free of cracks (bubbles and inclusions) | |
Optical doped | Mg/Fe/Zn/MgO etc for optical grade LN< wafers per requested | |
Wafer Surface Criteria | Refractive index | No=2.2878/Ne=2.2033 @632nm wavelength/prism coupler method. |
Contamination, | None | |
Particles ¢>0.3 µ m | <= 30 | |
Scratch, Chipping | None | |
Defect | No edge cracks, scratches, saw marks, stains |
Material | Congruent Lithium Niobate wafer (White or Black) | |
Curie Temp | 1142±2.0℃ | |
Cutting Angle | X/Y/Z etc | |
Diameter/size | 2”/3”/4” | |
Tol(±) | <0.20 mm | |
Thickness | 0.1 ~ 0.5mm or more | |
Primary Flat | 16mm/22mm /32mm | |
TTV | <3µm | |
Bow | -30<bow<30 | |
Warp | <40µm | |
Orientation Flat | All available | |
Surface Type | Single Side Polished /Double Sides Polished | |
Polished side Ra | <0.5nm | |
S/D | 20/10 | |
Edge Criteria | R=0.2mm or Bullnose | |
Optical doped | Fe/Zn/MgO, etc. for optical grade LN< wafers | |
Wafer Surface Criteria | Refractive index | No=2.2878/Ne=2.2033 @632nm wavelength |
Contamination, | None | |
Particles ¢>0.3 µ m | <= 30 | |
Scratch, Chipping | None | |
Defect | No edge cracks, scratches, saw marks, stains |
Material | 3" 4" 6" LN wafer (Optical grade) |
Orientation | X & Z |
Surface finish | single or double-sided polish (DLP/SLP/SSP/DSP all available ) |
Thickness | 0.18/0.25/0.35/0.50/1.00 mm |
TTV | <1~5µm |
BOW | ± (25µm ~40um ) |
Warp | <= 35µm |
LTV (5mmx5mm) | <1.5 um |
PLTV(<0.5um) | ≥98% (5mm*5mm) with 2mm edge excluded |
Curie Temp | 1142°C±3°C |
Edge | Compl't with SEMI M1.2@with GC800#. regular at C typed |
Orientation flats | available, per request |
Doped with | Er:LN, MgO:LN, Fe:LN, Er:MgO:LN |
Polished side Ra | Roughness Ra<=5A |
Back Side Criteria | Roughness Ra:0.5-1.0µm GC#1000 |
Edge Rounding | Compliant with SEMI M1.2 Standard/refer to IEC62276 |
Cracks, saw marks, stains | None |
Single Domain | Completed Polarization/Reduced |
Layers | Parameters | Specifications | |||||||||
Top Functional Layer | Material | Lithium Niobate, Lithium Tantalate | |||||||||
Diameter | 3" | 4" | 6" | 8" | |||||||
Primary flat orientation | per request deg(°) | ||||||||||
Secondary flat orientation | per request | ||||||||||
Film Thickness Averages thickness | 300–600 nm | ||||||||||
Surface orientation | X-cut or per request | ||||||||||
Front side/face roughness | Optical polished | ||||||||||
Isolation Layer | Buried Oxide avg thickness | 4600 nm | 4700 nm | 4800 nm | |||||||
Buried Oxide thickness uniformity | -5% | 0% | 5% | ||||||||
Support Substrate | Material | SI/LN/SAPPHIRE/QUARTZ/ETC | |||||||||
Diameter | 3", | 4" | 6" | 8" | |||||||
Support layer total thickness | 525 nm | 525 nm | 625 nm | 725 nm | |||||||
Device growth method | CZ | CZ | ZVD | hydrothermal | |||||||
Device orientation | {100}, 0.5 deg (°) | ||||||||||
Device doping type | N | ||||||||||
Device dopant | Phos | ||||||||||
Surface finish | 10 nm |
Lithium Niobate (LiNbO3) Substrate will be securely packaged in sturdy containers with cushioning materials to prevent movement or damage during shipping. This careful packaging ensures that the product arrives in perfect condition, maintaining its high-quality standards throughout the delivery process.
Heeger Materials Inc., a professional supplier and manufacturer of high-quality Single Crystal Substrates products including Lithium Niobate (LiNbO3) Substrate, leverages extensive expertise in supply and export to offer competitive prices. We provide customized solutions to meet specific requirements, ensuring exceptional quality and customer satisfaction.
Heeger Materials Inc. was established in 2016 in Colorado, USA. We specialize in premium-grade metals, alloys, ceramics, powders, and other materials catering to research, development, and large-scale industrial production in scientific and industrial sectors.
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